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Proceedings Paper

Characteristics of the higher-order resonant cantilever in dynamic atomic force microscopy
Author(s): Yang Zhao; Qiang-xian Huang; Dan Yuan; Huan-jie You; Hong Xie
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Paper Abstract

In order to improve the performances of dynamic atomic force microscopy (AFM), a higher-order resonant cantilever which is driven at its second order or even higher-order resonant frequency instead of its first order resonant frequency is proposed. Due to the increase in the frequency and quality factor of the higher-order resonant cantilever, the response time, air damping coefficient are reduced and the detecting sensitivity of the cantilever is improved. Meanwhile, because the angular deflection of the cantilever under higher-order resonant vibration is larger than that under the first order resonant vibration, the optical magnification level of the higher-order resonant cantilever is several times larger than that of the first order when the optical lever method is adopted to detect the variation of the cantilever. Theoretical analysis and experimental results show that the scanning method done by a higher-order cantilever is effective and feasible, and the scanning characteristics of dynamic AFM with the higher-order resonant cantilever are promoted obviously compared with that of the AFM operated in the first-order.

Paper Details

Date Published: 10 October 2013
PDF: 7 pages
Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 89160F (10 October 2013); doi: 10.1117/12.2035924
Show Author Affiliations
Yang Zhao, Hefei Univ. of Technology (China)
Anhui Jianzhu Univ. (China)
Qiang-xian Huang, Hefei Univ. of Technology (China)
Dan Yuan, Hefei Univ. of Technology (China)
Huan-jie You, Hefei Univ. of Technology (China)
Hong Xie, Hefei Univ. of Technology (China)


Published in SPIE Proceedings Vol. 8916:
Sixth International Symposium on Precision Mechanical Measurements
Shenghua Ye; Yetai Fei, Editor(s)

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