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Proceedings Paper

Effect of transmitting beam position error on the imaging quality of a Fourier telescope
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Paper Abstract

The effect of beam position error on the imaging quality of a Fourier telescope is analyzed in this paper. First, the origin of the transmitting beam position error and the error types are discussed. Second, a numerical analysis is performed. To focus on the transmitting beam position error, other noise sources exclusive of the reconstruction process are neglected. The Strehl ratio is set to be the objective function and the transfer function of the position error is constructed. Based on the numerical model, the features of Strehl ratio reduction caused by position error are deduced. Third, simulations are performed to study the position error effect on the imaging quality. A plot of the Strehl ratio versus the different levels of position errors is obtained and the simulation results validate the numerical model to a certain extent. According to the simulation results, a high value of the transmitting beam position error obviously degrades the imaging quality of the system; thus, it is essential to contain the position error within a relatively low level.

Paper Details

Date Published: 19 September 2013
PDF: 10 pages
Proc. SPIE 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications, 89052X (19 September 2013); doi: 10.1117/12.2035843
Show Author Affiliations
Zhi-sheng Zhou, Univ. of Science and Technology of China (China)
Xiang-Li Bin, Univ. of Science and Technology of China (China)
Academy of Opto-Electronics (China)
Wen-xi Zhang, Academy of Opto-Electronics (China)
Yang Li, Academy of Opto-Electronics (China)
Xin-xin Kong, Academy of Opto-Electronics (China)
Xiao-yu Lv, Academy of Opto-Electronics (China)


Published in SPIE Proceedings Vol. 8905:
International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications
Farzin Amzajerdian; Astrid Aksnes; Weibiao Chen; Chunqing Gao; Yongchao Zheng; Cheng Wang, Editor(s)

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