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Proceedings Paper

Roundness measuring instrument for 2-dimensional standards
Author(s): Wei Nong Wang
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Paper Abstract

Combined with an optical probe and a traditional roundness measuring instrument, a new type of roundness measuring instruments for 2-dimensional patterns has been developed. The instrument inherits measurement procedure and evaluation method of traditional roundness measuring instrument, aiming to unify the evaluation methods of roundness measurements for 2D- and 3D- objects. The roundness of 2-dimensional patterns on this instrument is then calculated from more than 3600 points per circle; the filters can be selected like traditional roundness measuring instruments. This roundness result includes more information than the measurement with only around 30 points by imaging probe CMMs. It should be calibrated for a 2-dimensional pattern if it will work as reference objects. Special reference objects are designed for adjustment of the developed instrument. Researches were done for the traceability of the instrument. A reference sphere was used for traceability of the rotatory shaft and a laser interferometer for the optical sensor. The instrumental uncertainty is U=0.16μm (k=2). Based on the one-year-long test, the stability of the instrument is excellent.

Paper Details

Date Published: 10 October 2013
PDF: 8 pages
Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 891632 (10 October 2013); doi: 10.1117/12.2035806
Show Author Affiliations
Wei Nong Wang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8916:
Sixth International Symposium on Precision Mechanical Measurements
Shenghua Ye; Yetai Fei, Editor(s)

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