Share Email Print
cover

Proceedings Paper

Digital approach to stabilizing optical frequency combs and beat notes of CW lasers
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In cases when it is necessary to lock optical frequencies generated by an optical frequency comb to a precise radio frequency (RF) standard (GPS-disciplined oscillator, H-maser, etc.) the usual practice is to implement phase and frequency-locked loops. Such system takes the signal generated by the RF standard (usually 10 MHz or 100 MHz) as a reference and stabilizes the repetition and offset frequencies of the comb contained in the RF output of the f-2f interferometer. These control loops are usually built around analog electronic circuits processing the output signals from photo detectors. This results in transferring the stability of the standard from RF to optical frequency domain. The presented work describes a different approach based on digital signal processing and software-defined radio algorithms used for processing the f-2f and beat-note signals. Several applications of digital phase and frequency locks to a RF standard are demonstrated: the repetition (frep) and offset frequency (fceo) of the comb, and the frequency of the beat note between a CW laser source and a single component of the optical frequency comb spectrum.

Paper Details

Date Published: 10 October 2013
PDF: 6 pages
Proc. SPIE 8916, Sixth International Symposium on Precision Mechanical Measurements, 89161H (10 October 2013); doi: 10.1117/12.2035733
Show Author Affiliations
Martin Čížek, Institute of Scientific Instruments (Czech Republic)
Ondřej Číp, Institute of Scientific Instruments (Czech Republic)
Radek Šmíd, Institute of Scientific Instruments (Czech Republic)
Jan Hrabina, Institute of Scientific Instruments (Czech Republic)
Břetislav Mikel, Institute of Scientific Instruments (Czech Republic)
Josef Lazar, Institute of Scientific Instruments (Czech Republic)


Published in SPIE Proceedings Vol. 8916:
Sixth International Symposium on Precision Mechanical Measurements
Shenghua Ye; Yetai Fei, Editor(s)

© SPIE. Terms of Use
Back to Top