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Proceedings Paper

Tuning parameters and performance of a real-time depth-resolved wavefront sensor
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Paper Abstract

In this report, we demonstrate characteristics and parameters of a coherence-gated Shack-Hartmann wavefront sensor (CG/SH-WFS) that is capable of measuring depth-resolved wavefront aberrations. A technique of dynamic centroiding is applied to CG/SH-WFS images and its precision is evaluated. The performance of the CG/SH-WFS system is compared with a commercial SH-WFS measuring a reflective surface. Real-time wavefront measurements from a scattering sample are also presented. The experiments demonstrate that the performance of CG/SH-WFS can replace conventional SHWFS and also provide its unique advantages.

Paper Details

Date Published: 29 August 2013
PDF: 6 pages
Proc. SPIE 8914, International Symposium on Photoelectronic Detection and Imaging 2013: Fiber Optic Sensors and Optical Coherence Tomography, 89141G (29 August 2013); doi: 10.1117/12.2035314
Show Author Affiliations
Jingyu Wang, Univ. of Kent (United Kingdom)
Adrian Gh. Podoleanu, Univ. of Kent (United Kingdom)


Published in SPIE Proceedings Vol. 8914:
International Symposium on Photoelectronic Detection and Imaging 2013: Fiber Optic Sensors and Optical Coherence Tomography
Yunjiang Rao, Editor(s)

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