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Proceedings Paper

A device for examing the imaging plane’s illumination nonuniformity of Wide FOV and short-focus optical imaging system
Author(s): Deng-kui Kang; Chang-lu Jiang; Liang Yuan; Jia-ming Lin; Hong Yang; Xue Zheng; Yu Guo; Shi-bang Ma
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Paper Abstract

The imaging plane’s illumination nonuniformity is an important parameter for wide FOV and short-focus optical imaging system.But now the imaging plane’s illumination nonuniformity measurement device can not meet the requirements of wide FOV, high uniformity and wide dynamic range.A new device combined with assymmetric double-hemisphere technology was set up. It was composed of the special integrating sphere, CCD camera, precision displacement mechanism, image acquisition, and testing software.The CCD was pre-calibrated and the testing software realized a auto-correction,image acquisition, display and the illumination nonuniformity calulation.The light source was calibrated by the national standard color temperature lamp.The device can provide a Lambert object surface .The advantages of the device were that the FOV was as largely as 100°,and a wide illumination range of (10-3~103)Lx was achieved. An optimal simulation of assymmetric double-hemisphere was calculated by LightTools,it was proved that the illuminace nonuniformity at the outlet was better than 1.7%.Finally, the illumination nonuniformity of the integrating sphere and a wide FOV and short-focus lens were respectively measured.The results show that, the illumination uniformity of the integrating sphere is less than or equal to 1.49%,and the imaging plane’s illumination nonuniformity of the lens is 10.24%.

Paper Details

Date Published: 21 August 2013
PDF: 10 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89082Q (21 August 2013); doi: 10.1117/12.2035272
Show Author Affiliations
Deng-kui Kang, Xi’an Institute of Applied Optics (China)
Chang-lu Jiang, Xi'an Institute of Applied Optics (China)
Liang Yuan, Xi'an Institute of Applied Optics (China)
Jia-ming Lin, Beijing Institute of Technology (China)
Hong Yang, Xi'an Institute of Applied Optics (China)
Xue Zheng, Xi'an Institute of Applied Optics (China)
Yu Guo, Xi'an Institute of Applied Optics (China)
Shi-bang Ma, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)

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