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Proceedings Paper

Sound of nano
Author(s): Jon Aylott; Matt Clark; Leonel Marques; Fernando Perez-Cota; Richard J. Smith; Kevin F. Webb
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Paper Abstract

Ultrasound is widely used for imaging, measurement and diagnostics in the MHz region and is perhaps most familiar as a medical or non-destructive imaging or measurement tool. In the MHz frequency range the wavelength is typically measured in microns and is many times longer than the wavelength of visible light, limiting its resolution to objects much larger than the nano-scale. It is possible to perform ultrasonic imaging and measurement at much higher frequencies, in the GHz region. Here the acoustic wavelength is typically less than that of light permitting the higher resolutions than optical microscopy and the ability to probe micro and nano-scale objects. At these high frequencies ultrasonics has much to offer the nano-world as a powerful diagnostic tool: it could be used in circumstances where optical microscopy, electron microscopy and probe microscopy cannot, such as inside living objects. Despite the potential that ultrasonics offers for imaging and measurement at the micro and nano-scale, performing ultrasonics at the nano-scale is hampered by many problems that render the techniques typically used in the MHz region impractical. In this paper we discuss some of the practical problems standing in the way of nano-ultrasonics and some of the solutions, especially the use of pico-second laser ultrasonics and the development of nano-ultrasonic transducers and their application to ultrasonic imaging inside living cells.

Paper Details

Date Published: 7 December 2013
PDF: 8 pages
Proc. SPIE 8923, Micro/Nano Materials, Devices, and Systems, 892325 (7 December 2013); doi: 10.1117/12.2035176
Show Author Affiliations
Jon Aylott, The Univ. of Nottingham (United Kingdom)
Matt Clark, The Univ. of Nottingham (United Kingdom)
Leonel Marques, The Univ. of Nottingham (United Kingdom)
Fernando Perez-Cota, The Univ. of Nottingham (United Kingdom)
Richard J. Smith, The Univ. of Nottingham (United Kingdom)
Kevin F. Webb, The Univ. of Nottingham (United Kingdom)


Published in SPIE Proceedings Vol. 8923:
Micro/Nano Materials, Devices, and Systems
James Friend; H. Hoe Tan, Editor(s)

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