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Proceedings Paper

Evanescent field scanning optical microscopy
Author(s): Vitaly Sukharenko; Roger Dorsinville
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Paper Abstract

The authors propose an alternative method for high resolution optical microscopy - Evanescent Field Scanning Optical Microscopy (EFSOM) which eliminates implementation of the scanning tip compare to classical NSOM technique. The approach involves scanning a sample in the evanescent-field of a prism generated using total internal reflection (TIR) and recording the reflected power as a function of position. The reflection pattern of the wave is collected and processed, using comparative differentiation. The extracted information is processed further to eliminate any distortions. The system is not limited by diffraction and resolution primarily depends on the characteristics of the photo-detector and scanning velocity. Implementation of thin silver layer and coupling of incident radiation into Surface Plasmons Polaritons (SPP) improves system sensitivity and reduces photo detector dynamic range requirements.

Paper Details

Date Published: 7 March 2014
PDF: 8 pages
Proc. SPIE 8982, Optical Components and Materials XI, 89821C (7 March 2014); doi: 10.1117/12.2035166
Show Author Affiliations
Vitaly Sukharenko, The City College of New York (United States)
Roger Dorsinville, The City College of New York (United States)


Published in SPIE Proceedings Vol. 8982:
Optical Components and Materials XI
Michel J. F. Digonnet; Shibin Jiang, Editor(s)

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