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Proceedings Paper

Ray-tracing algorithm based on BRDF
Author(s): Li Zheng; Hongxia Mao; Kaifeng Wu
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Paper Abstract

A new arithmetic is put forward for calculating the scattering of complicated rough surface, which based on ray-tracing with BRDF. When the direction of the incident ray is fixed, the direction of the reflected ray is decided by rejection/acceptance sampling, and the standard of rejection/acceptance sampling is based on the BRDF of the surface. The reflected rays well reflect the scattering character of the complicated rough surface when there are a great lot of incident rays. Integrating the BRDF of targets into traditional ray-tracing, it could calculate the scattering of complicated surface. The test result proves the practicability of the method.

Paper Details

Date Published: 11 September 2013
PDF: 9 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890757 (11 September 2013); doi: 10.1117/12.2034938
Show Author Affiliations
Li Zheng, Science and Technology on Optical Radiation Lab. (China)
Hongxia Mao, Science and Technology on Optical Radiation Lab. (China)
Kaifeng Wu, Science and Technology on Optical Radiation Lab. (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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