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Proceedings Paper

Solid-state ultrafast all-optical x-ray imaging sensor enabling picosecond temporal resolution
Author(s): Bo Wang; Yonglin Bai; Peng Xu; Baiyu Liu; Bingli Zhu; Wenzheng Yang; Xiaohong Bai; Junjun Qin; Yongsheng Gou
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Paper Abstract

Here we report an ultrafast x-ray imaging sensor based on optical measurement of the effects of x-ray absorption and electron hole pair creation in a direct band-gap semiconductor. Our results indicate that this technology can be used to provide a new approach for x-ray detectors and x-ray imaging systems with picosecond temporal resolution at x-ray energies ~10 keV. The x-ray absorption in GaAs produces a transient, non-equilibrium, electron-hole pair distribution which is then sensed by the phase modulation of the optical probe beam. The basic physics of the detector, implementation considerations, and preliminary experimental data are presented and discussed. Through further development, this x-ray imaging sensor could provide insight into previously unmeasurable phenomena in many fields.

Paper Details

Date Published: 21 August 2013
PDF: 4 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89082C (21 August 2013); doi: 10.1117/12.2034893
Show Author Affiliations
Bo Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Yonglin Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Peng Xu, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Baiyu Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Bingli Zhu, Xi'an Institute of Optics and Precision Mechanics (China)
Wenzheng Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Xiaohong Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Junjun Qin, Xi'an Institute of Optics and Precision Mechanics (China)
Yongsheng Gou, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)

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