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Proceedings Paper

Infrared image quality evaluation method without reference image
Author(s): Song Yue; Tingting Ren; Chengsheng Wang; Bo Lei; Zhijie Zhang
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Paper Abstract

Since infrared image quality depends on many factors such as optical performance and electrical noise of thermal imager, image quality evaluation becomes an important issue which can conduce to both image processing afterward and capability improving of thermal imager. There are two ways of infrared image quality evaluation, with or without reference image. For real-time thermal image, the method without reference image is preferred because it is difficult to get a standard image. Although there are various kinds of methods for evaluation, there is no general metric for image quality evaluation. This paper introduces a novel method to evaluate infrared image without reference image from five aspects: noise, clarity, information volume and levels, information in frequency domain and the capability of automatic target recognition. Generally, the basic image quality is obtained from the first four aspects, and the quality of target is acquired from the last aspect. The proposed method is tested on several infrared images captured by different thermal imagers. Calculate the indicators and compare with human vision results. The evaluation shows that this method successfully describes the characteristics of infrared image and the result is consistent with human vision system.

Paper Details

Date Published: 11 September 2013
PDF: 8 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89074X (11 September 2013); doi: 10.1117/12.2034887
Show Author Affiliations
Song Yue, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Tingting Ren, Jiuzhiyang Infrared System Co., Ltd. (China)
Chengsheng Wang, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Bo Lei, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Zhijie Zhang, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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