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Proceedings Paper

Adaptive non-uniformity correction method based on temperature for infrared detector array
Author(s): Zhijie Zhang; Song Yue; Pu Hong; Guowei Jia; Bo Lei
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Paper Abstract

The existence of non-uniformities in the responsitivity of the element array is a severe problem typical to common infrared detector. These non-uniformities result in a “curtain’’ like fixed pattern noises (FPN) that appear in the image. Some random noise can be restrained by the method kind of equalization method. But the fixed pattern noise can only be removed by .non uniformity correction method. The produce of non uniformities of detector array is the combined action of infrared detector array, readout circuit, semiconductor device performance, the amplifier circuit and optical system. Conventional linear correction techniques require costly recalibration due to the drift of the detector or changes in temperature. Therefore, an adaptive non-uniformity method is needed to solve this problem. A lot factors including detectors and environment conditions variety are considered to analyze and conduct the cause of detector drift. Several experiments are designed to verify the guess. Based on the experiments, an adaptive non-uniformity correction method is put forward in this paper. The strength of this method lies in its simplicity and low computational complexity. Extensive experimental results demonstrate the disadvantage of traditional non-uniformity correct method is conquered by the proposed scheme.

Paper Details

Date Published: 11 September 2013
PDF: 8 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89074V (11 September 2013); doi: 10.1117/12.2034883
Show Author Affiliations
Zhijie Zhang, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Song Yue, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Pu Hong, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Guowei Jia, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)
Bo Lei, Huazhong Institute of Electro-Optics-Wuhan National Lab. for Optoelectronics (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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