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Proceedings Paper

Reliability design of CMOS image sensor for space applications
Author(s): Ning Xie; Shijun Chen; Yongping Chen
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Paper Abstract

In space applications, sensors work in very harsh space environment. Thus the reliability design must be carefully considered. This paper addresses the techniques which effectively increase the reliability of CMOS image sensors. A radiation tolerant pixel design which is implemented in a sun tracker sensor is presented. Measurement results of total dose radiation, SEL, SEU, etc prove the radiation immunity of the sensor.

Paper Details

Date Published: 21 August 2013
PDF: 6 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89082B (21 August 2013); doi: 10.1117/12.2034876
Show Author Affiliations
Ning Xie, Shanghai Institute of Technical Physics (China)
Shijun Chen, Shanghai Institute of Technical Physics (China)
Yongping Chen, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)

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