Share Email Print
cover

Proceedings Paper

Four-step spatial phase-shifting lateral shearing interferometry by a crossed grating and a linear grating
Author(s): Zhen-yan Guo; Yang Song; Jia Wang; Zhenhua Li; An-zhi He
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Moiré tomography has been considered as an effective tool in studying flow fields because of its advantages such as non-contact measurement, strong anti-disturbing capability, and wide measurement range. The spatial phase-shifting method, which can simultaneously obtain several phase-shifted interferograms, can be applied in the flow field measurements by the moiré tomography when the flow field varies rapidly. In this paper, we present a new spatial phase-shifting shearing interferometry. The optical structure of the interferometry, which only consists of a crossed grating and a linear grating, is very simple. With it six phase-shifted interferograms can be acquired simultaneously. Based on the scalar diffraction theory, the explicit forms of intensity distribution of the interferograms containing the phase information can be derived and a corresponding four-step phase-shifting algorithm is proposed to extract the first-order partial derivative of phase projection from the interferograms. Finally, the spatial phase shifting optical system is used to retrieve the first-order partial derivative of propane flame phase projection produced by plane incident wave. This work is crucial to accuracy reconstruction the physical parameter of the varied flow fields in moiré tomography.

Paper Details

Date Published: 19 December 2013
PDF: 11 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904606 (19 December 2013); doi: 10.1117/12.2034671
Show Author Affiliations
Zhen-yan Guo, Nanjing Univ. of Science and Technology (China)
Yang Song, Nanjing Univ. of Science and Technology (China)
Jia Wang, Nanjing Univ. of Science and Technology (China)
Zhenhua Li, Nanjing Univ. of Science and Technology (China)
An-zhi He, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

© SPIE. Terms of Use
Back to Top