Share Email Print
cover

Proceedings Paper

MTF measurement of IRFPA based on double-knife edge scanning method
Author(s): Cheng-ping Ying; Bin Wu; Heng-fei Wang; Xue-shun Shi; Hong-yuan Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Modulation transfer function (MTF) is one of the most important parameters of infrared focal plane array (IRFPA). A double-knife edge scanning method is proposed for MTF measurement of IRFPA. In this method, a double-knife edge was used as a target, and the IRFPA under test was positioned in the focal plane of the imaging optical system by a 3-axis translation stage. With an IRFPA data acquisition system, the image of the double-knife edge was restored. By scanning in the direction orthogonal to the double-knife edge image, edge spread function (ESF) curve of each pixel swept across the knife-edge image was obtained. MTF could be calculated from the subsequent fitting, differential and Fourier transformation procedures. With double-knife edge scanning, two ESF curves of double-knife edge were obtained simultaneously, and symmetry of the two ESF curves could be used to evaluate the verticality between photosensitive surface of IRFPA and optical axis of the double-knife edge imaging system. In addition, this method can be used to judge the existing of interference from outside such as vibration, stray light and electrical noise. A measurement facility for IRFPA’s MTF based on double-knife edge scanning method was also established in this study. The facility is composed of double-knife edge imaging optical system, 3-axis translation stage and data acquisition system, et al. As the kernel of the facility, the double-knife edge imaging optical system mainly comprises two symmetrical parabolic mirrors coating with reflective material, and the magnification of the optical system is 1 with an operation wavelength range of (1∼14) μm.

Paper Details

Date Published: 11 September 2013
PDF: 7 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890746 (11 September 2013); doi: 10.1117/12.2034552
Show Author Affiliations
Cheng-ping Ying, China Electronics Technology Group Corp. (China)
Bin Wu, China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test & Measurement Lab. (China)
Heng-fei Wang, China Electronics Technology Group Corp. (China)
Xue-shun Shi, China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test & Measurement Lab. (China)
Hong-yuan Liu, China Electronics Technology Group Corp. (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

© SPIE. Terms of Use
Back to Top