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Proceedings Paper

MTF measurement of IRFPA based on double-knife edge scanning method
Author(s): Cheng-ping Ying; Bin Wu; Heng-fei Wang; Xue-shun Shi; Hong-yuan Liu
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Paper Abstract

Modulation transfer function (MTF) is one of the most important parameters of infrared focal plane array (IRFPA). A double-knife edge scanning method is proposed for MTF measurement of IRFPA. In this method, a double-knife edge was used as a target, and the IRFPA under test was positioned in the focal plane of the imaging optical system by a 3-axis translation stage. With an IRFPA data acquisition system, the image of the double-knife edge was restored. By scanning in the direction orthogonal to the double-knife edge image, edge spread function (ESF) curve of each pixel swept across the knife-edge image was obtained. MTF could be calculated from the subsequent fitting, differential and Fourier transformation procedures. With double-knife edge scanning, two ESF curves of double-knife edge were obtained simultaneously, and symmetry of the two ESF curves could be used to evaluate the verticality between photosensitive surface of IRFPA and optical axis of the double-knife edge imaging system. In addition, this method can be used to judge the existing of interference from outside such as vibration, stray light and electrical noise. A measurement facility for IRFPA’s MTF based on double-knife edge scanning method was also established in this study. The facility is composed of double-knife edge imaging optical system, 3-axis translation stage and data acquisition system, et al. As the kernel of the facility, the double-knife edge imaging optical system mainly comprises two symmetrical parabolic mirrors coating with reflective material, and the magnification of the optical system is 1 with an operation wavelength range of (1∼14) μm.

Paper Details

Date Published: 11 September 2013
PDF: 7 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890746 (11 September 2013); doi: 10.1117/12.2034552
Show Author Affiliations
Cheng-ping Ying, China Electronics Technology Group Corp. (China)
Bin Wu, China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test & Measurement Lab. (China)
Heng-fei Wang, China Electronics Technology Group Corp. (China)
Xue-shun Shi, China Electronics Technology Group Corp. (China)
Science and Technology on Electronic Test & Measurement Lab. (China)
Hong-yuan Liu, China Electronics Technology Group Corp. (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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