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Proceedings Paper

Calculation of integral photoluminescence for the GaAs photocathode bonding assembly
Author(s): Chi Feng; Gangcheng Jiao; Wei Cheng; Chaxia Peng; Zhuang Miao
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Paper Abstract

The ideal status of the GaAs photocathode bonding assembly is as fellows: the GaAs photocathode should not have additional stress; the crystal lattice should keep integrity after deposited Si3N4 reflection reducing coating and bonging process that GaAs epitaxial material on a glass window. In order to estimating the bonding quality of the GaAs photocathode bonding assembly, integral photoluminescence intensity was calculated on the ideal bonding condition. Assuming the energy of incident light was absorbed by GaAs active layer except reflection, according to the optical character of the GaAs photocathode bonding assembly, the value was calculated. This value could be the standard to assess the quality of the GaAs photocathode bonding assembly and improve the bonding technology that the GaAs epitaxial material is bonded to a glass window.

Paper Details

Date Published: 16 August 2013
PDF: 9 pages
Proc. SPIE 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications, 891217 (16 August 2013); doi: 10.1117/12.2034461
Show Author Affiliations
Chi Feng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Gangcheng Jiao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Wei Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Chaxia Peng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)


Published in SPIE Proceedings Vol. 8912:
International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
Benkang Chang; Hui Guo, Editor(s)

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