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Proceedings Paper

Near-IR diode laser system for emission and process control
Author(s): Henrik Ahlberg; Stefan Helge Lundqvist; Torbjoern Andersson; Robert Tell
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Paper Abstract

In this paper a near-JR diode laser system for emission and process control has been designed and tested. The system utilizes derivative spectroscopy to increase the sensitivity of the measurement due to the low line strengths of the absorption lines in the 0.7 - 1.7 p.m wavelengths region. A minimum detectable absorbance of 2 iO-5 was obtained at an integration time of 3 ms. Oxygen was used in the experiments and the corresponding minimum detectable concentration was 200 ppm. No interference effects was observed from co-existing emission gases. The system utilizes a unique modulation concept for compensation of non'gas-related transmission variations in the measurement path. Due to the short response time the system is very useful for on-line process control.

Paper Details

Date Published: 1 August 1990
PDF: 5 pages
Proc. SPIE 1269, Environment and Pollution Measurement Sensors and Systems, (1 August 1990); doi: 10.1117/12.20344
Show Author Affiliations
Henrik Ahlberg, Chalmers Univ. of Technology (Sweden)
Stefan Helge Lundqvist, ALToptronic AB (Sweden)
Torbjoern Andersson, ALToptronic AB (Sweden)
Robert Tell, ALToptronic AB (Sweden)

Published in SPIE Proceedings Vol. 1269:
Environment and Pollution Measurement Sensors and Systems
Hans Ole Nielsen, Editor(s)

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