
Proceedings Paper
Data processing method based on surface and tangent vector deviations for freeform surfaceFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
Surface measurement and analysis are important to freeform surface optical systems. The deviation from designed
surface is generally regarded as a judging criterion of real surface quality. In off-axis optical systems, some freeform
surfaces contain no reference points. Measured data of such surfaces can only constitute a fitted surface, but the spatial
position of the fitted surface is difficult to be determined to make a smallest deviation from designed surface by internal
algorithms. In freeform surface optical systems, besides the surface deviations, the tangent vector variations of lattice
data of measured surface can also affect the image quality. Consequently the quality of freeform surface should be
appraised by both of tangent vector variations and surface deviations. This paper presents one method using first-order
differential to directly analyze and process the measured lattice data of freeform surfaces. This method assesses the
tangent vector variations of measured data and the smoothness of real surfaces, while does not involve the fitting
procedure with designed surfaces. In this paper, this method is applied to evaluate a set of measured lattice data of some
reflective freeform surfaces. Furthermore, some fitting algorithms are applied to assess the surface deviations between
the measured and designed surfaces as contrasts.
Paper Details
Date Published: 20 August 2013
PDF: 8 pages
Proc. SPIE 8913, International Symposium on Photoelectronic Detection and Imaging 2013: Optical Storage and Display Technology, 89130U (20 August 2013); doi: 10.1117/12.2034366
Published in SPIE Proceedings Vol. 8913:
International Symposium on Photoelectronic Detection and Imaging 2013: Optical Storage and Display Technology
Changsheng Xie; Yikai Su; Liangcai Cao, Editor(s)
PDF: 8 pages
Proc. SPIE 8913, International Symposium on Photoelectronic Detection and Imaging 2013: Optical Storage and Display Technology, 89130U (20 August 2013); doi: 10.1117/12.2034366
Show Author Affiliations
Published in SPIE Proceedings Vol. 8913:
International Symposium on Photoelectronic Detection and Imaging 2013: Optical Storage and Display Technology
Changsheng Xie; Yikai Su; Liangcai Cao, Editor(s)
© SPIE. Terms of Use
