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Proceedings Paper

Optical nonlinearity measurements of copper phthalocyanine film
Author(s): Li-hao Luo; Yu Fang; Xiang-yong Chu; Xing-zhi Wu; Junyi Yang; Ying-lin Song
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Paper Abstract

The nonlinear refractive response of a copper phthalocyanine film fabricated by the electro-deposition is investigated by a modified top-hat Z-scan with 19 picoseconds pulse at wavelength of 532 nm. Compared to the top-hat Z-scan, the curve of modified top-hat Z-scan for the nonlinear refraction shows a single peak rather than a peek-valley curve. Furthermore, the sensitivity of this new technique can be more than two orders of magnitude enhanced. The results show that the film has obvious response of nonlinear refraction. The theoretical simulation fit well with experimental results.

Paper Details

Date Published: 17 September 2013
PDF: 6 pages
Proc. SPIE 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications, 890412 (17 September 2013); doi: 10.1117/12.2034318
Show Author Affiliations
Li-hao Luo, Soochow Univ. (China)
Yu Fang, Soochow Univ. (China)
Xiang-yong Chu, Soochow Univ. (China)
Xing-zhi Wu, Soochow Univ. (China)
Junyi Yang, Soochow Univ. (China)
Ying-lin Song, Soochow Univ. (China)
Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 8904:
International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications
Andreas Tünnermann; Zejin Liu; Pu Wang; Chun Tang, Editor(s)

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