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Proceedings Paper

Temperature characteristic of InAs/Ga(In)Sb middle wavelength infrared detectors
Author(s): Yan-li Shi; Rui Hui; Wei-Feng Zhang; Wen-Jin He; Jin Yuan; Jiang-Min Feng; Fan Li; Li-Ming Liu
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Paper Abstract

InAs/Ga(In)Sb type-II superlattice infrared detectors based on mature III-V material and devices technology has lots of advantages such as tunable energy structure and wide response wavelength range, low dark current and high performance under high temperature, etc. It has been chosen as the Third-Generation infrared detector and developed rapidly in recent ten years. In this paper both theoretical and experimental study have been performed to indicate high temperature operation characterization for the InAs/Ga(In)Sb type-II superlattice middle wavelength infrared detectors . Photo-generated carriers, the ratio of photo conductance and dark conductance were calculated by balance equation method. The dependence of I-V, optical response, device detectivity on temperature has been tested and studied to disclose temperature characteristic of the InAs/Ga(In)Sb type-II superlattice infrared detectors. The results verify the middle wavelength InAs/Ga(In)Sb type-II superlattice infrared detectors can operate at high temperature with high performance.

Paper Details

Date Published: 11 September 2013
PDF: 9 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890702 (11 September 2013); doi: 10.1117/12.2034304
Show Author Affiliations
Yan-li Shi, Kunming Institute of Physics (China)
Rui Hui, Kunming Institute of Physics (China)
Wei-Feng Zhang, Kunming Institute of Physics (China)
Wen-Jin He, Kunming Institute of Physics (China)
Jin Yuan, Kunming Institute of Physics (China)
Jiang-Min Feng, Kunming Institute of Physics (China)
Fan Li, Kunming Institute of Physics (China)
Li-Ming Liu, Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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