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Proceedings Paper

High speed optical nanoscopy by stimulated emission depletion (STED) with galvo mirrors
Author(s): Shuai Li; Cui-fang Kuang; Yi-fan Wang; Xiang Hao; Peng Xiu; Ying-ke Xu; Xu Liu
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Paper Abstract

Stimulated emission depletion microscopy (STED) has been proved to be a feasible and straightforward method of breaking the conventional diffraction barrier in the far-field. In this paper, we design and setup a home-built high speed STED microscope. Both the excitation beam (488nm) and the depletion beam (592nm) are provided by continuous wave lasers. By using a pair of galvo mirrors (TILL Yanus IV Digital Scan Head), we realize a pixel dwell time down to 2 μs in the experiment which enables an acquisition speed of 2 frames per second in an imaging field of 5*5 μm with an individual pixel size of 10nm. The image acquisition process is controlled by the software Imspector. In the manuscript, we give a clear description on how to build the microscope and also conduct several experiments to evaluate its performance in practice. A spatial resolution of <100nm, which is well beyond the diffraction barrier has been demonstrated in both nanoparticles and biomedical samples. Featuring a superresolution together with a high imaging speed, our STED microscope has big potential to be widely applied in related scientific researches.

Paper Details

Date Published: 23 August 2013
PDF: 8 pages
Proc. SPIE 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications, 89110D (23 August 2013); doi: 10.1117/12.2034070
Show Author Affiliations
Shuai Li, Zhejiang Univ. (China)
Cui-fang Kuang, Zhejiang Univ. (China)
Yi-fan Wang, Zhejiang Univ. (China)
Xiang Hao, Zhejiang Univ. (China)
Peng Xiu, Zhejiang Univ. (China)
Ying-ke Xu, Zhejiang Univ. (China)
Xu Liu, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 8911:
International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications
Min Gu; Xiaocong Yuan; Min Qiu, Editor(s)

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