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Proceedings Paper

Research of Temporal Speckle Pattern Interferometry for in-plane measurement
Author(s): Guangyu Li; Zhan Gao; Yan Deng
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Paper Abstract

In this paper, a ridge algorithm which is based on wavelet analysis is adopted in the measurement of in-plane displacement. To measure in-plane displacement by electronic speckle pattern interferometry (ESPI), a series of speckle patterns are captured with the help of a CCD camera which is known as temporal speckle pattern interferometry (TSPI) technique and TSPI technique has better correlation and a larger measuring range compared with ESPI technique. To retrieve the phase fluctuation caused by the displacement of specimen, three types of complex wavelets are selected in the wavelet analysis to compare with the traditional Fourier analysis.

Paper Details

Date Published: 19 December 2013
PDF: 10 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 904603 (19 December 2013); doi: 10.1117/12.2034061
Show Author Affiliations
Guangyu Li, Beijing Jiaotong Univ. (China)
Zhan Gao, Beijing Jiaotong Univ. (China)
Yan Deng, Beijing Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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