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Proceedings Paper

Analysis of scattering of an on-axis zero-order Bessel beam by a chiral sphere
Author(s): Tan Qu; Zhen-sen Wu; Yuan Mou; Zheng-jun Li
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Paper Abstract

By right of its non-diffracting and self-constructing property, Bessel beam has gained growing attentions from scholars since its naissance. Current research on the scattering of Bessel beam by particles is almost focused on isotropic media. The study on bi-isotropic material is exiguous. Chiral media is a kind of bi-isotropic material with its nonreciprocity being zero. Hence the exploration on the interaction between Bessel beam and chiral material is extremely urgent. Its optically active property can be widely used in optical and electromagnetic activities. In this paper, zero-order Bessel beam was expanded in terms of spherical vector wave functions (SVWFs). Combing with the expansion of the internal electromagnetic field of the chiral media in SVWFs, the analytical solution to the scattering of chiral sphere illuminated by an on-axis zero-order Bessel beam is investigated by utilizing the continuous boundary conditions. The on-axis Bessel beam is degenerated to a plane wave incident on a chiral sphere, and the results are found to be in good agreement with the literature available. The effects of beam, particle parameters, and on-axis beam waist center shift z0 on the scattered intensity are numerically analyzed. It is revealed that: the maximum of scattered intensity appears in the direction or neighboring direction of conical angle, which is different from the case of Gaussian beam whose maximum exists at forward direction; the impacts of chirality and radius of the sphere on the extremum and distribution of scattered intensity are very large. The theory present here on the investigation of the light scattering characteristics of the chiral particles may play an important role in the fields of the applications of chiral material and chiral-coated target in microwave engineering and shielding targets.

Paper Details

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Proc. SPIE 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications, 89040U; doi: 10.1117/12.2033723
Show Author Affiliations
Tan Qu, Xidian Univ. (China)
Zhen-sen Wu, Xidian Univ. (China)
Yuan Mou, Xidian Univ. (China)
Zheng-jun Li, Xidian Univ. (China)


Published in SPIE Proceedings Vol. 8904:
International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications
Andreas Tünnermann; Zejin Liu; Pu Wang; Chun Tang, Editor(s)

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