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Proceedings Paper

Induced current measurement in bridgewire EED through infrared optical fiber image bundle
Author(s): Liwei Xin; Tao Wang; Jinshou Tian; Fei Yin; Yanan Hu; Zhenyu Song; Jin Yang; Jingzhi Yin
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Paper Abstract

While bridgewire electroexplosive device (EED) works in electromagnetic environment, conventional methods can introduce electromagnetism interference. A new method of measuring the induced current in EED is proposed in this article. It bases on infrared imagingto detect the inducting current from long distance and non-contact. The infrared optical fiber image bundle coupling with infrared CCD detector is used to detect the infrared images.At first,the thermal field images are acquired by infrared CCD detector. Then the value of weak induced current of corresponding bridgewire is further determined according to the relations of gray scale values and temperature, temperature and current. The experiment results show that bridgewire current is accurately measured by this method. This method offers a new way to evaluate electromagnetic effect of EED.

Paper Details

Date Published: 19 September 2013
PDF: 10 pages
Proc. SPIE 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications, 890518 (19 September 2013); doi: 10.1117/12.2033704
Show Author Affiliations
Liwei Xin, Xi'an Institute of Optics and Precision Mechanics (China)
Tao Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Jinshou Tian, Xi'an Institute of Optics and Precision Mechanics (China)
Fei Yin, Xi'an Institute of Optics and Precision Mechanics (China)
Yanan Hu, Xi'an Institute of Optics and Precision Mechanics (China)
Zhenyu Song, Jilin Univ. (China)
Jin Yang, Xi'an Institute of Optics and Precision Mechanics (China)
Jingzhi Yin, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 8905:
International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications
Farzin Amzajerdian; Astrid Aksnes; Weibiao Chen; Chunqing Gao; Yongchao Zheng; Cheng Wang, Editor(s)

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