Share Email Print
cover

Proceedings Paper

Study on electron scrubbing methods of Cs2Te ultraviolet double-MCP image intensifiers
Author(s): Hui Liu; Liu Feng; Lian-dong Zhang; Xiang Gao; Zhuang Miao; Sen Niu; Long Wang; Xiao-hui Zhang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Single-MCP Cs2Te solar blind ultraviolet image intensifier couldn’t detect weaker ultraviolet radiation, such as the ultraviolet radiation near high-voltage wire insulating column. To increase the ultraviolet radiation gain, the double-MCP, tri-MCP or multi-MCP units are introduced into ultraviolet image intensifiers. In this paper, two pieces of MCP are cascaded in "V" shape as the electron multiplier of ultraviolet image intensifiers. Processed and scrubbed by the single-MCP electron scrubbing traditional technology, the desired effect after electron scrubbing still could not be achieved and flicker phenomenon appeared in field of view. The flicker noise appeared when the image intensifier was working because the second MCP was not efficiently scrubbed. In order to completely scrub the two pieces of MCP simultaneously, eliminate the flicker noise, reduce the dark current and achieve a stable MCP gain, the double-MCP electron scrubbing method should be optimized without changing the assembly process. Combined with MCP pre-treatment and pre-electron-scrubbing before assembled and scrubbed in “V” shape, flicker noise could be eliminated effectively, and dark current could be lowered, which could increase the gain and get a clear field of view. Comparing with two different methods of double-MCP electron scrubbing, either method has its own advantages and disadvantages. Ultraviolet radiation gain can be increased from 103~104 cd·m-2/W·m-2 to 1.0×105 cd·m-2/W·m-2 by using method of pre-treatment and pre-electron-scrubbing. With prospective ultraviolet radiation gain achieved, double-MCP Cs2Te solar blind ultraviolet image intensifier is manufactured.

Paper Details

Date Published: 16 August 2013
PDF: 8 pages
Proc. SPIE 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications, 89120O (16 August 2013); doi: 10.1117/12.2033680
Show Author Affiliations
Hui Liu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Liu Feng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Lian-dong Zhang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Xiang Gao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Sen Niu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Long Wang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Xiao-hui Zhang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)


Published in SPIE Proceedings Vol. 8912:
International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
Benkang Chang; Hui Guo, Editor(s)

© SPIE. Terms of Use
Back to Top