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Proceedings Paper

High illumination resolution test of low-light-level image intensifier
Author(s): Xiaofeng Bai; Lei Yin; Yufeng Zhu; Yingping He; Zhuang Miao; Wen Hu; Zhipeng Hou; Hongli Shi
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Paper Abstract

High illumination resolution, which directly determines the applied characteristic of night vision system in flashlight or high light level condition, is an important performance parameter for evaluating the characteristic of low light level image intensifier used in high light level condition. In this article, according to the limited resolution test technique, the test principle, test condition and test method to high illumination resolution are described in detail associated with operation mode and protective way of low light level image intensifier. Test system for measuring the high illumination resolution has been founded based on the limited resolution test system. The value of high illumination for measuring the high illumination resolution has been calculated in theory and measured by illuminometer. High illumination resolution of low light level image intensifiers have been measured in test system, results show that high illumination resolution test system is satisfied the need for measuring high illumination resolution of low light level image intensifier, and test system output light illumination must be greater than 1×103 lux. Light of high illumination, which can be correctly measured by illuminometer, is transferred legitimately. That is worthwhile to evaluate the operational characteristic of low light level image intensifier.

Paper Details

Date Published: 16 August 2013
PDF: 7 pages
Proc. SPIE 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications, 89120L (16 August 2013); doi: 10.1117/12.2033671
Show Author Affiliations
Xiaofeng Bai, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Lei Yin, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Yufeng Zhu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Yingping He, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Wen Hu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Zhipeng Hou, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)
Hongli Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
North Night-Vision Science & Technology Group Co., Ltd. (China)


Published in SPIE Proceedings Vol. 8912:
International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
Benkang Chang; Hui Guo, Editor(s)

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