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Proceedings Paper

Study on the radiation property of high temperature gas relation with flight altitude and velocity
Author(s): Weihua Meng; Hang Xu; Jingbo Xiang; Jiangtao Song
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Paper Abstract

While flying in the aerosphere at high speed, it will form shock wave around the noddle of flight vehicle. The radiation of hot air behind shock wave is a major factor responsible for the infrared signature of the vehicle, and has an important influence on the infrared detection system mounted in it. Calculating the infrared radiation of high temperature gas is significant for selecting an optimal detection band and improving detection capability of the IR system. In this paper, focused on the high-speed flight in typical altitude, the line-by-line method was adopted to calculate the radiation properties of high temperature gas around the noddle of the vehicle to study the relationship with the flight altitude and velocity. At first, based on the flight altitude, the related parameters of the flow, such as pressure, temperature and density, were calculated using the standard atmosphere model. Then, the parameters of the air which had passed through the shock wave were calculated according to the shock wave theory. At last, the line-by-line method had been used to calculate the radiant absorption coefficient of high temperature gas in different velocity and flight altitude. The results of calculation show that in the same velocity, the average absorption coefficient of high temperature gas is smaller while the higher flight altitude; in the same flight altitude, the coefficient is bigger while the higher velocity. And so, while flying in low altitude with high speed, the radiation of the hot air should be taken into consideration more carefully for infrared system design.

Paper Details

Date Published: 30 August 2013
PDF: 8 pages
Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 891016 (30 August 2013); doi: 10.1117/12.2033668
Show Author Affiliations
Weihua Meng, Beijing Institute of Technology (China)
Luoyang Optoelectro Technology Development Ctr. (China)
Hang Xu, Luoyang Optoelectro Technology Development Ctr. (China)
Jingbo Xiang, Luoyang Optoelectro Technology Development Ctr. (China)
Jiangtao Song, Luoyang Optoelectro Technology Development Ctr. (China)


Published in SPIE Proceedings Vol. 8910:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
Lifu Zhang; Jianfeng Yang, Editor(s)

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