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Proceedings Paper

Area uniformity measurement method for infrared radiation of extended blackbody
Author(s): Shunli Han; Wen-jian Luo; Wei-liang Hu; Rui-xia Wang; Qing-yao Han
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Paper Abstract

Extended area blackbody has wide applications in the development process of infrared optical systems and test instruments. The emissive area uniformity of extended area blackbody directly influences the reliability and accuracy of the entire test and calibration systems. For the demands of high-precision test, a uniformity measurement method based on high-resolution, high-precision infrared radiation temperature measurement and real-time calibration is put forward. The experiments prove that this method can satisfy the precision demands and provide a reference basis in the application of uniformity correction. It has broad application prospects.

Paper Details

Date Published:
PDF: 6 pages
Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, ; doi: 10.1117/12.2033537
Show Author Affiliations
Shunli Han, China Electronic Science of Technology Group Co., Ltd. (China)
Wen-jian Luo, China Electronic Science of Technology Group Co., Ltd. (China)
Wei-liang Hu, China Electronic Science of Technology Group Co., Ltd. (China)
Rui-xia Wang, China Electronic Science of Technology Group Co., Ltd. (China)
Qing-yao Han, China Electronic Science of Technology Group Co., Ltd. (China)


Published in SPIE Proceedings Vol. 9046:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Jigui Zhu, Editor(s)

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