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Proceedings Paper

Automatic analysis of optical time domain reflectometer (OTDR) measurement results
Author(s): Andrezej Kowalski; S. Kuklinski; A. Zakrzewski
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Paper Abstract

In the paper the influence of noise on automated detection and analysis of splices in long optical telecommunication lines is discussed.

Paper Details

Date Published: 1 March 1995
PDF: 5 pages
Proc. SPIE 2202, Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing, (1 March 1995); doi: 10.1117/12.203324
Show Author Affiliations
Andrezej Kowalski, Warsaw Univ. of Technology (Poland)
S. Kuklinski, Warsaw Univ. of Technology (Poland)
A. Zakrzewski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 2202:
Laser Technology IV: Research Trends, Instrumentation, and Applications in Metrology and Materials Processing
Wieslaw L. Wolinski; Zdzislaw Jankiewicz; Jerzy K. Gajda; Bohdan K. Wolczak, Editor(s)

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