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Proceedings Paper

A flexible modeling and calibration for the optical triangulation probe using a planar pattern
Author(s): Yimin Lin; Naiguang Lu; Xiaoping Lou
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Paper Abstract

The optical triangulation probe (OTP), which consists of a light spot projector and a camera, has found widespread applications for three-dimensional (3D) measurement and quality control of products in the industrial manufacturing. The OTP calibration is an extremely important issue, since the performances such as high accuracy and repeatability are crucially depended on the calibration results. This paper presents a flexible approach for modeling and calibration of the OTP, which only requires planar patterns observed from a few different orientations and light spots projected on the planes as well. For the calibration procedure, the structure parameters of the OTP are calculated, such as the camera extrinsic and intrinsic parameters which include the coefficients of the lens distortion, and the directional equation for the light axis of the projector. For the measuring procedure, the formulations of 3D computation are concisely described using the calibration results. Experimental tests of the real system confirm the suitable accuracy and repeatability. Furthermore, the technique proposed here is easily generalized for the OTP integration in robot arms or Coordinate Measuring Machines (CMMs).

Paper Details

Date Published: 19 December 2013
PDF: 12 pages
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 90450Z (19 December 2013); doi: 10.1117/12.2033179
Show Author Affiliations
Yimin Lin, Beijing Univ. of Posts and Telecommunications (China)
Beijing Information Science and Technology Univ. (China)
Naiguang Lu, Beijing Information Science and Technology Univ. (China)
Beijing Univ. of Posts and Telecommunications (China)
Xiaoping Lou, Beijing Information Science and Technology Univ. (China)


Published in SPIE Proceedings Vol. 9045:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Xinggang Lin; Jesse Zheng, Editor(s)

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