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Proceedings Paper

New scene-based adaptive bad pixel detection algorithm for IRFPA
Author(s): Han-bing Leng; Zuo-feng Zhou; Wei Liu; Bo Yi; Qing-sheng Xie; Deng-shan Wu; Jian-zhong Cao
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Paper Abstract

Traditional bad pixel detection algorithm is always based on the radiometric calibration. This method is easy to operate, but only suitable for the bad pixels whose positions are fixed. During the longtime operation period, environment temperature usually has drastic influence on IRFPA, the number of bad pixels often increase and their positions also vary, this result in the degradation of infrared image quality. In this paper, a new scene-based adaptive bad pixel detection algorithm is proposed for IRFPA. The algorithm firstly comparing the pixel value with its neighborhood, and affirm bad pixels preliminary through a suitable threshold. Then the potential bad pixels from different scene are matched, false bad pixels caused by scene and targets are eliminated, real bad pixels are confirmed. The essence of the proposed algorithm is using the correlation between the pixel and its neighborhood. The bad pixels and some targets in the scene have a weak correlation within neighborhoods, and the position of bad pixels varies slowly while the scene varies drastically when IRFPA is in use. This new method can be implemented in hardware easily and achieve the real time demand. With the real infrared images obtained from a camera, the experiment results show the effectiveness of the proposed algorithm.

Paper Details

Date Published: 11 September 2013
PDF: 6 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89072T (11 September 2013); doi: 10.1117/12.2033162
Show Author Affiliations
Han-bing Leng, Xi'an Institute of Optics and Precision Mechanics (China)
Zuo-feng Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Wei Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Bo Yi, Xi'an Institute of Optics and Precision Mechanics (China)
Qing-sheng Xie, Xi'an Institute of Optics and Precision Mechanics (China)
Deng-shan Wu, Xi'an Institute of Optics and Precision Mechanics (China)
Jian-zhong Cao, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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