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Proceedings Paper

Target detection technology based on polarization imaging in the complex environment
Author(s): Qiang Fu; Hui-lin Jiang; Jin Duan; Chun-he Mo; Shu-ming Zhuang; Yong-he Yang
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Paper Abstract

The polarization imaging detection technology has some advantages in revealling targets in complex background, identify stealthy, camouflage, dim, false target, and "penetrating smoke". This article summarizes foreign polarization imaging detection technology development process, the status and development trends, and discusses the foreign technical level, further research on key technology of polarization imaging detection, put forward a scheme of the detection system based on polarization imaging in complex environment, through increasing the polarization dimension information based on intensity imaging , on which intensity and spectrum cannot reflect, and can significantly enhance the difference between target and background, increase influencing distance in the haze, smoke and dust environment , through the analysis, we elucidated the feasibility and availability of the system, in order to enhance the future of the target detection and recognition ability of photoelectric equipment.

Paper Details

Date Published: 19 September 2013
PDF: 9 pages
Proc. SPIE 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications, 89050W (19 September 2013); doi: 10.1117/12.2033152
Show Author Affiliations
Qiang Fu, Changchun Univ. of Science and Technology (China)
Hui-lin Jiang, Changchun Univ. of Science and Technology (China)
Jin Duan, Changchun Univ. of Science and Technology (China)
Chun-he Mo, Changchun Univ. of Science and Technology (China)
Shu-ming Zhuang, Changchun Univ. of Science and Technology (China)
Yong-he Yang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8905:
International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications
Farzin Amzajerdian; Astrid Aksnes; Weibiao Chen; Chunqing Gao; Yongchao Zheng; Cheng Wang, Editor(s)

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