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Proceedings Paper

Analysis of the modulation efficiency of imaging Fourier transform spectrometers
Author(s): Yan-peng Fu; Xun-niu Li; Wei-jian Zheng; Ning-fang Liao; Jun-hong Su
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Paper Abstract

The concept of high-throughput imaging Fourier transform spectrometer is introduced. Starting from the principle of the lateral shearing interferometer, it analyses the decline reason for the signal modulation efficiency and theoretically analyses the several aspects of the surface errors of the plane mirror, the beamsplitter properties change and the incident light angle influence the modulation efficiency. Based on analysis results, some expressions of modulation efficiency are provided. Furthermore, the relationship between modulation efficiency and performance parameters is pointed out. The reasons for the interferometer signal modulation efficiency decline can contain the following several aspects: (1) the influence of the surface errors of the plane mirror, (2) the polarization state change because of the influence of the reflection and the transmission in the light incident process makes the signal modulation efficiency decline, (3) the influence of the incident light angle. The results show that: this class of system is inherently optomechanics robust, no-moving part system, simple and compact structure, easy assembly and adjustment, strong vibration resistance as well as high resolution and high-throughput. Our results will provide a theoretical and practical guide for studying, developing and engineering Michelson lateral shearing interference imaging spectrometers. It can be widely used in the long-wave infrared (LWIR) imaging spectrometer system for thermal infrared remote sensing community.

Paper Details

Date Published: 30 August 2013
PDF: 8 pages
Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 89100R (30 August 2013); doi: 10.1117/12.2032799
Show Author Affiliations
Yan-peng Fu, Beijing Institute of Technology (China)
Kunming Institute of Physics (China)
Xun-niu Li, Beijing Institute of Technology (China)
Kunming Institute of Physics (China)
Wei-jian Zheng, Beijing Institute of Technology (China)
Kunming Institute of Physics (China)
Ning-fang Liao, Beijing Institute of Technology (China)
Jun-hong Su, Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 8910:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
Lifu Zhang; Jianfeng Yang, Editor(s)

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