Share Email Print
cover

Proceedings Paper

Edge signal enhancement characteristic of the X-ray phase contrast imaging technology
Author(s): Jie Wu; Jiabi Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper combines the Fresnel diffraction theory and the Fourier transform method based on the physical X-ray refraction, and establishes the second-order differential model expression of edge structure enhancement characteristics for the X-ray phase contrast imaging system. Then carries out the three-dimensional prototype simulation and real physical experiments to observe and study the edge structure enhancement characteristics. The simulation and real physical experiments images results validate that the micro focus X-ray phase-contrast imaging has the feature of edge enhancement, and this can be used to highlight the trivial edge structure information of those weak absorption objects.

Paper Details

Date Published:
PDF
Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 89100P; doi: 10.1117/12.2032795
Show Author Affiliations
Jie Wu, Univ. of Shanghai for Science and Technology (China)
Jiabi Chen, Univ. of Shanghai for Science and Technology (China)


Published in SPIE Proceedings Vol. 8910:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
Lifu Zhang; Jianfeng Yang, Editor(s)

© SPIE. Terms of Use
Back to Top