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Proceedings Paper

Detection of dim targets in multiple environments
Author(s): Grace M. Mirsky; Matthew Woods; Robert J. Grasso
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Paper Abstract

The proliferation of a wide variety of weapons including Anti-Aircraft Artillery (AAA), rockets, and small arms presents a substantial threat to both military and civilian aircraft. To address this ever-present threat, Northrop Grumman has assessed unguided threat phenomenology to understand the underlying physical principles for detection. These principles, based upon threat transit through the atmosphere, exploit a simple phenomenon universal to all objects moving through an atmosphere comprised of gaseous media to detect and track the threat in the presence of background and clutter. Threat detection has rapidly become a crucial component of aircraft survivability systems that provide situational awareness to the crew. It is particularly important to platforms which may spend a majority of their time at low altitudes and within the effective range of a large variety of weapons. Detection of these threats presents a unique challenge as this class of threat typically has a dim signature coupled with a short duration. Correct identification of each of the threat components (muzzle flash and projectile) is important to determine trajectory and intent while minimizing false alarms and maintaining a high detection probability in all environments.

Paper Details

Date Published: 15 October 2013
PDF: 6 pages
Proc. SPIE 8898, Technologies for Optical Countermeasures X; and High-Power Lasers 2013: Technology and Systems, 88980J (15 October 2013); doi: 10.1117/12.2032770
Show Author Affiliations
Grace M. Mirsky, Northrop Grumman Corp. (United States)
Matthew Woods, Northrop Grumman Corp. (United States)
Robert J. Grasso, Northrop Grumman Corp. (United States)


Published in SPIE Proceedings Vol. 8898:
Technologies for Optical Countermeasures X; and High-Power Lasers 2013: Technology and Systems
David H. Titterton; Mark A. Richardson; Robert J. Grasso; Harro Ackermann; Willy L. Bohn, Editor(s)

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