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Proceedings Paper

High performance BGMI circuit for VLWIR FPAs
Author(s): Li-chao Hao; Hong-lei Chen; Ai-bo Huang; Jun-ling Zhang; Rui-jun Ding
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Paper Abstract

An improved CMOS readout integrated circuit (ROIC) for N-on-P very long wavelength (VLWIR) detectors is designed, which has the ability to operate with a simple background suppression. It increases the integration time and the signal-to-noise ratio (SNR) of image data. A buffered gate modulation input (BGMI) cell as input circuit provides a low input resistance, high injection efficiency, and precise biasing voltage to the photodiode. By theoretically analyzing the characteristic parameters of MOS device at low temperature, a high gain’s feedback amplifier is devised which using a differential stage to provide the inverting gain to improve linearity and to provide tight control of the detector bias. The final chip is fabricated with HHNEC 0.35um 1P4M process technology. The measurement results of the fabricated readout chip under 50K have successfully verified both readout function and performance improvement. With the 5.0V power supply, ROIC provides the output dynamic range over 2.5V. At the same time, the total power dissipation is less than 200mW, and the maximum readout speed is more than 2.5MHz.

Paper Details

Date Published: 11 September 2013
PDF: 6 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89071Q (11 September 2013); doi: 10.1117/12.2032760
Show Author Affiliations
Li-chao Hao, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Hong-lei Chen, Shanghai Institute of Technical Physics (China)
Ai-bo Huang, Shanghai Institute of Technical Physics (China)
Jun-ling Zhang, Shanghai Institute of Technical Physics (China)
Rui-jun Ding, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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