Share Email Print
cover

Proceedings Paper

An algorithm used for quality criterion automatic measurement of band-pass filters and its device implementation
Author(s): Qianshun Liu; Yan Liu; Feihong Yu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As a kind of film device, band-pass filter is widely used in pattern recognition, infrared detection, optical fiber communication, etc. In this paper, an algorithm for automatic measurement of band-pass filter quality criterion is proposed based on the proven theory calculation of derivate spectral transmittance of filter formula. Firstly, wavelet transform to reduce spectrum data noises is used. Secondly, combining with the Gaussian curve fitting and least squares method, the algorithm fits spectrum curve and searches the peak. Finally, some parameters for judging band-pass filter quality are figure out. Based on the algorithm, a pipeline for band-pass filters automatic measurement system has been designed that can scan the filter array automatically and display spectral transmittance of each filter. At the same time, the system compares the measuring result with the user defined standards to determine if the filter is qualified or not. The qualified product will be market with green color, and the unqualified product will be marked with red color. With the experiments verification, the automatic measurement system basically realized comprehensive, accurate and rapid measurement of band-pass filter quality and achieved the expected results.

Paper Details

Date Published: 30 August 2013
PDF: 6 pages
Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 89100K (30 August 2013); doi: 10.1117/12.2032611
Show Author Affiliations
Qianshun Liu, Zhejiang Univ. (China)
Yan Liu, Zhejiang Univ. (China)
Feihong Yu, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 8910:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
Lifu Zhang; Jianfeng Yang, Editor(s)

© SPIE. Terms of Use
Back to Top