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Proceedings Paper

Real-time depth-resolved Shack-Hartmann measurements
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Paper Abstract

We demonstrate a direct Shack-Hartmann wavefront sensing method that allows depth-resolved measurements. A coherence-gate Shack-Hartmann wavefront sensor (CG/SH-WFS) is implemented by adding low coherence reflectometry gating to a SH-WFS. The depth resolution is determined by the coherence gate, much narrower than the depth range of the SH-WFS. Distinctive wavefronts are measured from five layers in a multiple-layer target. This paves the way towards depth-resolved closed-loop adaptive optics assisted microscopy and imaging of the retina.

Paper Details

Date Published: 18 June 2013
PDF: 6 pages
Proc. SPIE 8802, Optical Coherence Tomography and Coherence Techniques VI, 88020B (18 June 2013); doi: 10.1117/12.2032507
Show Author Affiliations
Jingyu Wang, Univ. of Kent (United Kingdom)
Adrian Gh. Podoleanu, Univ. of Kent (United Kingdom)

Published in SPIE Proceedings Vol. 8802:
Optical Coherence Tomography and Coherence Techniques VI
Brett E. Bouma; Rainer A. Leitgeb, Editor(s)

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