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Proceedings Paper

Resolution performance of the extra ultraviolet telescopes
Author(s): Huai-yang Fu; Sizhong Zhou; Kai Jiang; Chao Mei
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Paper Abstract

The Extreme Ultraviolet Telescopes (EUT) Operates at wavelengths between 100-1000 Å. As an important parameter of the telescope system, before the launch, angular resolution is necessary to be calibrated for testing the imaging performance of EUT. However, the difficulty and expense of fabricating optical testing systems capable of imaging the characteristic EUV wavelengths, has precluded in working wavelength resolution testing. This article taken a Ritchey–Chrétien normal incidence optical system as sample and resolution tests were carried out at visible wavelength. Based on this measurement, the angular resolution error budget at visible wavelength was calculated. At working wavelength, we added the squares of the pointing jitter error, the resolution focusing error and the scattering error, to the theoretical Rayleigh diffraction limit at the wavelength of operation, and then take the square root of this sum, an upper limit estimate of telescope’s resolution was obtained about 0.4705 arcsec. This result proved that the EUT worked at diffraction-limited level and the resolution performance has met the demand of design.

Paper Details

Date Published: 21 August 2013
PDF: 7 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89080H (21 August 2013); doi: 10.1117/12.2032376
Show Author Affiliations
Huai-yang Fu, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Sizhong Zhou, Xi'an Institute of Optics and Precision Mechanics (China)
Kai Jiang, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Chao Mei, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)

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