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Proceedings Paper

Effect of ion barrier film on the noise characteristics of proximity focusing low-light-level image intensifier
Author(s): De Song; Chunyang Liu; Xulei Qin; Shanshan Yu; Kuncheng Fu; Xiaofeng Bai; Xin Wang; Ye Li; Qingduo Duanmu
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Paper Abstract

To analyze the effect of ion barrier film in micro-channel plate on the performance of proximity focusing low-light-level image intensifier, the noise characteristics of ion barrier film are studied. The transmission electrons’ distribution for those have transmitted ion barrier films is determined by simulating the collision interaction between the incident electrons and ion barrier film with Monte Carlo method. Furthermore, the relationship model of the incident electrons and transmission electrons are established by time differential method. We simulate how the incident electron energy and ion barrier film thickness affect the noise factor of ion barrier film. The simulation analysis results reveal that the noise factors gradually decreased with the increase of incident electron energy (0.1 KeV - 2.0 KeV) and decreasing of film thickness (1 to 8 nm). So the tendency of simulation results is accordant with the actual devices. The smaller noise factor means the better image quality for low-light-level image device, and the simulation results suggest how to realize the ion barrier film in low light level image intensifier with low noise factor. Therefore, the study of ion barrier film’s noise characteristics provides theoretical and technical support for optimization of the three generations low-light-level device’s performance.

Paper Details

Date Published: 16 August 2013
PDF: 7 pages
Proc. SPIE 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications, 89120A (16 August 2013); doi: 10.1117/12.2032298
Show Author Affiliations
De Song, Changchun Univ. of Science and Technology (China)
Science and Technology on Low-Light-Level Night Vision Lab. (China)
Chunyang Liu, Changchun Univ. of Science and Technology (China)
Xulei Qin, Changchun Univ. of Science and Technology (China)
Shanshan Yu, Changchun Univ. of Science and Technology (China)
Kuncheng Fu, Changchun Univ. of Science and Technology (China)
Xiaofeng Bai, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Xin Wang, Changchun Univ. of Science and Technology (China)
Ye Li, Changchun Univ. of Science and Technology (China)
Qingduo Duanmu, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8912:
International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
Benkang Chang; Hui Guo, Editor(s)

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