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Proceedings Paper

NIR-Vis-UV permittivity of nanoporous C-Pd thin films determined using spectroscopic ellipsometry
Author(s): Aleksandra A. Wronkowska; Grażyna Czerniak; Andrzej Wronkowski; Elżbieta Czerwosz; Ewa Kowalska
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Paper Abstract

In this work, spectroscopic ellipsometry combined with transmittance measurements in a spectral range of 0.6 - 6.5eV (2.2μm – 193nm) have been used to determine the thickness and optical constants of carbon-palladium thin films. The C-Pd nanocomposite samples are synthesised by physical vapour deposition and chemical vapour deposition methods on to fused silica substrates. The C60 fullerene and palladium acetate are used as the source materials. The effective complex dielectric functions [equation-see manuscript] of the particulate films are found to depend strongly on preparation technology and concentration of Pd nanoparticles embedded in the carbon matrix. Optical parameterisation with a Drude-Lorentz model of the dielectric functions has been applied to match the experimental data. Influence of chemical treatment and Pd nanoparticles on structural disorder and relevant optical and electronic properties of the C-Pd samples is analysed.

Paper Details

Date Published: 25 October 2013
PDF: 8 pages
Proc. SPIE 8903, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013, 89030F (25 October 2013); doi: 10.1117/12.2032241
Show Author Affiliations
Aleksandra A. Wronkowska, Univ. of Technology and Life Sciences (Poland)
Grażyna Czerniak, Univ. of Technology and Life Sciences (Poland)
Andrzej Wronkowski, Univ. of Technology and Life Sciences (Poland)
Elżbieta Czerwosz, Tele&Radio Research Institute (Poland)
Ewa Kowalska, Tele&Radio Research Institute (Poland)


Published in SPIE Proceedings Vol. 8903:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2013
Ryszard S. Romaniuk, Editor(s)

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