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Proceedings Paper

Power scaling and beam divergence compression of bottom-emitting vertical-cavity surface-emitting lasers
Author(s): Xing Zhang; Yongqiang Ning; Jianwei Zhang; Jian Zhang; Jinsheng Zhang; Peng Jia; Xiushan Li; Jingjing Shi; Li Qin; Yun Liu; Cunzhu Tong; Lijun Wang
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Paper Abstract

Power scaling and beam divergence compression of 980 nm bottom-emitting vertical-cavity surface-emitting lasers (VCSELs) are presented in this paper. First, the relationships among the reflectivity of the n-doped distributed Bragg reflector, threshold current, and output power were analyzed, and the n-DBR reflectivity was optimized to achieve higher slope efficiency in a relatively low threshold current. Second, the influence of the p-contact on the current density distribution inside the active region was analyzed using the three-dimensional finite-element method. Uniform current distribution was achieved by optimizing the diameter of the p-contact, and a consequent improvement in beam divergence was observed. A low divergence of 5.4° was obtained for a single device with continuous-wave (CW) of 1.46 W at room temperature. The 8×8 VCSEL array showed a divergence angle of 10.2° at 4A. This array afforded a CW output power of 1.95 W under an injected current of 4 A and a pulse output power of 115 W under a pulse drive current of 130 A, a pulse width of 100 ns, and a repetition frequency of 100 Hz. VCSEL array chips were packaged in series to form a “quasi-array” to further increase the output power. This series achieved a peak output power of 475 W under a pulse drive current of 120 A.

Paper Details

Date Published: 17 September 2013
PDF: 12 pages
Proc. SPIE 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications, 89040D (17 September 2013); doi: 10.1117/12.2032046
Show Author Affiliations
Xing Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yongqiang Ning, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jianwei Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Univ. of Chinese Academy of Sciences (China)
Jian Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Univ. of Chinese Academy of Sciences (China)
Jinsheng Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Univ. of Chinese Academy of Sciences (China)
Peng Jia, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Univ. of Chinese Academy of Sciences (China)
Xiushan Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Univ. of Chinese Academy of Sciences (China)
Jingjing Shi, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Li Qin, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yun Liu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Cunzhu Tong, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Lijun Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 8904:
International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications
Andreas Tünnermann; Zejin Liu; Pu Wang; Chun Tang, Editor(s)

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