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Proceedings Paper

Design of high sensitivity detector for underwater communication system
Author(s): J. S. Cheong; J. S. L. Ong; J. S. Ng; A. B. Krysa; F. Bastiman; J. P. R. David
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Paper Abstract

Al0.52In0.48P is the largest bandgap material in III-V non-nitride semiconductors that is lattice matched to a readily available substrate (GaAs). Having a bandgap narrower than that of GaN enables it to detect wavelengths around 480 nm. Such wavelengths have the best transmittance underwater and may be used as a carrier in underwater communication systems. We present an Al0.52In0.48P homo-junction Separate-Absorption-Multiplication-Avalanche-Photodiode (SAMAPD) as a high sensitivity detector for such an application. By increasing the neutral and space-charge region thicknesses, the peak response wavelength can be tuned to longer wavelengths with a narrower full-width-half-maximum (FWHM). The quantum efficiency of the detector reduces with FWHM and this is compensated by having an avalanche gain. At room temperature, the SAM-APD has a dark current of <20 pA for a 210 μm radius device up to 99.9% of breakdown voltage. The structure gives a narrow spectral FWHM of 22 nm with centre wavelength of 482 nm. An external quantum efficiency of 33% and 6410% at 482 nm is obtained at bias voltage of -19 V and -92.6 V respectively.

Paper Details

Date Published: 5 November 2013
PDF: 9 pages
Proc. SPIE 8899, Emerging Technologies in Security and Defence; and Quantum Security II; and Unmanned Sensor Systems X, 88990G (5 November 2013); doi: 10.1117/12.2031953
Show Author Affiliations
J. S. Cheong, The Univ. of Sheffield (United Kingdom)
J. S. L. Ong, The Univ. of Sheffield (United Kingdom)
J. S. Ng, The Univ. of Sheffield (United Kingdom)
A. B. Krysa, The Univ. of Sheffield (United Kingdom)
F. Bastiman, The Univ. of Sheffield (United Kingdom)
J. P. R. David, The Univ. of Sheffield (United Kingdom)


Published in SPIE Proceedings Vol. 8899:
Emerging Technologies in Security and Defence; and Quantum Security II; and Unmanned Sensor Systems X
Edward M. Carapezza; Keith L. Lewis; Mark T. Gruneisen; Miloslav Dusek; Richard C. Hollins; Thomas J. Merlet; John G. Rarity, Editor(s)

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