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Proceedings Paper

Robustness of digital approach to mismatch compensation in analog circuits realized in nanometer technologies
Author(s): Zbigniew Jaworski; Piotr Wysokiński
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Paper Abstract

In this papers, a fully differential operational transconductance amplifier (OTA) implemented in 65 nm CMOS technology is analyzed to determine which component of the calibration circuitry is most susceptible to manufacturing process disturbances and thus impairs robustness of the calibration methodology. The average offset voltage of the OTA can be significantly reduced. It has been shown that effectiveness of the calibration methodology is limited by the offset voltage of the comparator that calculates sign of the OTA offset voltage.

Paper Details

Date Published: 25 July 2013
PDF: 7 pages
Proc. SPIE 8902, Electron Technology Conference 2013, 89020Z (25 July 2013); doi: 10.1117/12.2031697
Show Author Affiliations
Zbigniew Jaworski, Warsaw Univ. of Technology (Poland)
Piotr Wysokiński, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 8902:
Electron Technology Conference 2013
Pawel Szczepanski; Ryszard Kisiel; Ryszard S. Romaniuk, Editor(s)

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