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Proceedings Paper

Research on ESPI image enhancement technology
Author(s): Di Wu; Lei Dai; Chang-song Yu
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Paper Abstract

Electronic Speckle Pattern Interferometry (ESPI) technology is used for non-contact measurement. However, original ESPI images are with fluent speckle noise, which leads to low ratio of signal-to-noise. Both reducing the speckle noise and preserve the fringe pattern are important in EPSI image enhancement. Nowadays the partial differential equation method is widely used for EPSI image enhancement. It has advantages that can reduce speckle noise and protect the edge of fringe pattern. By discussing the factors of this method, comparing the enhancement results, we try to give out conclusion that the best choice for EPSI image enhancement applications.

Paper Details

Date Published: 19 September 2013
PDF: 5 pages
Proc. SPIE 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications, 890507 (19 September 2013); doi: 10.1117/12.2031695
Show Author Affiliations
Di Wu, Air Force Aviation Univ. (China)
Lei Dai, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Chang-song Yu, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 8905:
International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications
Farzin Amzajerdian; Astrid Aksnes; Weibiao Chen; Chunqing Gao; Yongchao Zheng; Cheng Wang, Editor(s)

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