Share Email Print
cover

Proceedings Paper

Inline contaminants detection with optical microfiber in high-power laser system
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The rudimental microparticle contaminants and airborne molecular contaminants (AMCs) will obviously reduce the lifetime of the lens widely used in the high peak power laser system. An inline contaminants sensor based on the optical microfiber (OM) is here proposed. Due to Van Der Waals force and electrostatic attraction, contaminants are easily adhered to the surface of OM, which will cause an obvious perturbation to the evanescent field transmitted in the OM. The additional loss, caused by the adhered contaminants, has been theoretically analyzed and simulated. The corresponding experiments have also been carried out, and the experimental results agree well with the simulation. The inline containments sensor based on OM has potentially wide sensing range for many kinds of determinate absorptive materials.

Paper Details

Date Published: 23 August 2013
PDF: 7 pages
Proc. SPIE 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications, 891104 (23 August 2013); doi: 10.1117/12.2031616
Show Author Affiliations
Zhengtong Wei, National Univ. of Defense Technology (China)
Zhangqi Song, National Univ. of Defense Technology (China)
Yang Yu, National Univ. of Defense Technology (China)
Xueliang Zhang, National Univ. of Defense Technology (China)
Zhou Meng, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 8911:
International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications
Min Gu; Xiaocong Yuan; Min Qiu, Editor(s)

© SPIE. Terms of Use
Back to Top