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Proceedings Paper

Wide absorption spectrum measuring methods by DFB-LDs in water vapor detection system
Author(s): Y. N. Liu; J. Chang; J. Lian; Q. Wang; G. P. Lv; W. J. Wang; Z. Liu; X. Z. Liu; S. S. Zhang; Z. L. Wang; S. Jiang; C. G. Zhu; W. Wei; B. N. Sun
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Paper Abstract

Two measuring methods of wide absorption spectrum by DFB-LDs are presented in detecting water vapor absorption line. One is subsection scanning method, it takes advantage of wide spectrum tuning range by temperature modulation and fast spectrum tuning speed by current modulation, specifically, this method is realized by dividing a target spectral region into several sections which corresponding to specific temperature of DFB-LD, and scanning every section by current modulation for hundreds times and average the data to raise SNR, combining all sections to get the whole spectrum. An accuracy of 10 ppmv had been obtained in the measurement of water vapor with a 10-cm path length by this method. Another is data fitting method, based on absorption line-shape function, the absorption line can be described by fitting with partial measured data. The fitting absorption line is fitted well with the measured data, and the square of correlation coefficient (R-square) is no less than 0.99.

Paper Details

Date Published: 15 October 2013
PDF: 4 pages
Proc. SPIE 8924, Fourth Asia Pacific Optical Sensors Conference, 89242S (15 October 2013); doi: 10.1117/12.2031608
Show Author Affiliations
Y. N. Liu, Shandong Univ. (China)
J. Chang, Shandong Univ. (China)
J. Lian, Shandong Univ. (China)
Q. Wang, Shandong Univ. (China)
G. P. Lv, Shandong Univ. (China)
W. J. Wang, Shandong Univ. (China)
Z. Liu, Shandong Univ. (China)
X. Z. Liu, Shandong Academy of Sciences (China)
S. S. Zhang, Shandong Univ. (China)
Z. L. Wang, Shandong Univ. (China)
S. Jiang, Shandong Univ. (China)
C. G. Zhu, Shandong Univ. (China)
W. Wei, Shandong Univ. (China)
B. N. Sun, Shandong Univ. (China)

Published in SPIE Proceedings Vol. 8924:
Fourth Asia Pacific Optical Sensors Conference
Minghong Yang; Dongning Wang; Yun-Jiang Rao, Editor(s)

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