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Proceedings Paper

Status of the EPIC thin and medium filters on-board XMM-Newton after more than 10 years of operation II: analysis of in-flight data
Author(s): Fabio Gastaldello; Marco Barbera; Alfonso Collura; Nicola La Palombara; Ugo Lo Cicero; Nicola Sartore; Andrea Tiengo; Salvatore Varisco
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Paper Abstract

After more than ten years of operation of the EPIC camera on board the X-ray observatory XMM-Newton we have reviewed the status of its thin and medium filters by performing both analysis of data collected in-flight and laboratory measurements on on-ground back-up filters. We have investigated the status of the EPIC thin and medium filters by performing an analysis of the optical loading in the PN offset maps to gauge variations in the optical and UV transmission of the filters. We both investigated repeated observations of single optically bright targets and performed a statistical analysis of the extent of loading versus visual magnitude at different epochs. We report the results of these measurements.

Paper Details

Date Published: 26 September 2013
PDF: 6 pages
Proc. SPIE 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII, 885915 (26 September 2013); doi: 10.1117/12.2030897
Show Author Affiliations
Fabio Gastaldello, INAF - Istituto di Astrofisica e Fisica Cosmica Milano (Italy)
Marco Barbera, Univ. degli Studi di Palermo (Italy)
Alfonso Collura, INAF - Osservatorio Astronomico di Palermo G.S. Vaiana (Italy)
Nicola La Palombara, INAF - Istituto di Astrofisica e Fisica Cosmica Milano (Italy)
Ugo Lo Cicero, INAF - Osservatorio Astronomico di Palermo G.S. Vaiana (Italy)
Nicola Sartore, INAF - Istituto di Astrofisica e Fisica Cosmica Milano (Italy)
Andrea Tiengo, INAF - Istituto di Astrofisica e Fisica Cosmica Milano (Italy)
Istituto Univ. di Studi Superiori Pavia (Italy)
INFN - Sezione di Pavia (Italy)
Salvatore Varisco, INAF - Osservatorio Astronomico di Palermo G.S. Vaiana (Italy)


Published in SPIE Proceedings Vol. 8859:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII
Oswald H. Siegmund, Editor(s)

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