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Proceedings Paper

Laser damage in dielectric films: What we know and what we don't
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Paper Abstract

Damage mechanisms in thin films are reviewed from femtosecond pulse to CW laser illumination. Special emphasis is given to the role of native and laser induced defects, recent successes and the need for better diagnostic tools.

Paper Details

Date Published: 14 November 2013
PDF: 10 pages
Proc. SPIE 8885, Laser-Induced Damage in Optical Materials: 2013, 888516 (14 November 2013); doi: 10.1117/12.2030894
Show Author Affiliations
Wolfgang Rudolph, Univ. of New Mexico (United States)
Luke Emmert, Univ. of New Mexico (United States)
Zhanliang Sun, Univ. of New Mexico (United States)
Dinesh Patel, Colorado State Univ. (United States)
Carmen Menoni, Colorado State Univ. (United States)


Published in SPIE Proceedings Vol. 8885:
Laser-Induced Damage in Optical Materials: 2013
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Editor(s)

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