Share Email Print

Proceedings Paper

Nematic liquid crystals in inverted microstrip structures
Author(s): Jerzy Piotrowski; Janusz Parka; Edward Nowinowski-Kruszelnicki
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Nematic liquid crystals are promising dielectrics for tunable microwave devices due to their significant birefringence and moderately low loss. Dielectric anisotropy or refractive index anisotropy of liquid crystal is one of the important parameter for the design of variety of reconfigurable devices. In this work, transmission line method is used for the broadband investigation of nematic liquid crystals in the frequency range of 1-10 GHz. For this purpose, a measurement device is proposed with a tunable liquid crystal transduces based on an inverted microstrip structure section placed between two segments of layered microstrip lines terminated by microstrip-coaxial line transitions. Measurements of the scattering parameters of the device with standard liquid crystal 6CHBT as well as with a novel highly anisotropic mixture W1825 have been conducted. Based on these measurements, a high effective refractive index anisotropy of 0.31 for the W1825 mixture compared to 0.12 for 6CHBT have been determined. These values are lower of 26% and 18% than anisotropy of the refractive indices appointed by a resonator method for W1825 and 6CHBT, respectively. Progress in highly anisotropic mixtures opens new low-cost liquid crystal applications in microwave devices.

Paper Details

Date Published: 25 July 2013
PDF: 7 pages
Proc. SPIE 8902, Electron Technology Conference 2013, 89022B (25 July 2013); doi: 10.1117/12.2030851
Show Author Affiliations
Jerzy Piotrowski, Warsaw Univ. of Technology (Poland)
Janusz Parka, Warsaw Univ. of Technology (Poland)
Military Univ. of Technology (Poland)
Edward Nowinowski-Kruszelnicki, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 8902:
Electron Technology Conference 2013
Pawel Szczepanski; Ryszard Kisiel; Ryszard S. Romaniuk, Editor(s)

© SPIE. Terms of Use
Back to Top